Noncontact atomic force microscopy for atomic-scale characterization of material surfaces
dc.citation.epage | 316 | en_US |
dc.citation.spage | 273 | en_US |
dc.contributor.author | Baykara, Mehmet Z. | en_US |
dc.contributor.editor | Kumar, C. S. S. R. | |
dc.date.accessioned | 2019-05-23T11:12:35Z | |
dc.date.available | 2019-05-23T11:12:35Z | |
dc.date.issued | 2015 | en_US |
dc.department | Department of Mechanical Engineering | en_US |
dc.department | Institute of Materials Science and Nanotechnology (UNAM) | en_US |
dc.description.abstract | Among the large variety of scanning probe microscopy techniques, noncontact atomic force microscopy (NC-AFM) stands out with its capability of atomic-resolution imaging and spectroscopy measurements on conducting, semiconducting as well as insulating sample surfaces. In this chapter, we review the fundamental experimental and instrumental methodology associated with the technique and present key results obtained on different classes of material surfaces. In addition to atomic-resolution imaging, the use of NC-AFM towards the goal of atomic-resolution force spectroscopy is emphasized. | en_US |
dc.description.provenance | Submitted by Evrim Ergin (eergin@bilkent.edu.tr) on 2019-05-23T11:12:34Z No. of bitstreams: 1 Noncontact_atomic_force_microscopy_for-atomic_scale_characterization_of_material_surfaces.pdf: 1709340 bytes, checksum: eb0c322872dd8603e2a817e7e2e660cd (MD5) | en |
dc.description.provenance | Made available in DSpace on 2019-05-23T11:12:35Z (GMT). No. of bitstreams: 1 Noncontact_atomic_force_microscopy_for-atomic_scale_characterization_of_material_surfaces.pdf: 1709340 bytes, checksum: eb0c322872dd8603e2a817e7e2e660cd (MD5) Previous issue date: 2015 | en |
dc.identifier.doi | 10.1007/978-3-662-44551-8 | en_US |
dc.identifier.eisbn | 9783662445518 | |
dc.identifier.isbn | 9783662445501 | |
dc.identifier.uri | http://hdl.handle.net/11693/51485 | |
dc.language.iso | English | en_US |
dc.publisher | Springer | en_US |
dc.relation.ispartof | Surface science tools for nanomaterials characterization | en_US |
dc.relation.isversionof | https://doi.org/10.1007/978-3-662-44551-8_8 | en_US |
dc.relation.isversionof | https://doi.org/10.1007/978-3-662-44551-8 | en_US |
dc.subject | Atomic force microscopy | en_US |
dc.subject | Atomic force spectroscopy | en_US |
dc.title | Noncontact atomic force microscopy for atomic-scale characterization of material surfaces | en_US |
dc.type | Book Chapter | en_US |
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