Observing inter-well and intra-well oscillations in buckled nanomechanical systems enabled by image processing

Limited Access
This item is unavailable until:
2024-12-08

Date

2023-12-08

Editor(s)

Advisor

Supervisor

Co-Advisor

Co-Supervisor

Instructor

Source Title

Journal of Applied Physics

Print ISSN

0021-8979

Electronic ISSN

1089-7550

Publisher

AIP Publishing LLC

Volume

134

Issue

22

Pages

Language

en

Journal Title

Journal ISSN

Volume Title

Series

Abstract

The scanning electron microscope (SEM) recordings of dynamic nano-electromechanical systems (NEMS) are difficult to analyze due to the noise caused by low frame rate, insufficient resolution, and blurriness induced by applied electric potentials. Here, we develop an image processing platform enhanced by the physics of the underlying system to track the motion of buckling NEMS structures in the presence of high noise levels. The algorithm is composed of an image filter, two data filters, and a nonlinear regression model, which utilizes the expected form of the physical solution. The method was applied to the recordings of a NEMS beam about 150 nm wide, undergoing intra- and inter-well post-buckling states with a transition rate of approximately 0.5 Hz. The algorithm can track the dynamical motion of the NEMS and capture the dependency of deflection amplitude on the compressive force on the beam. With the help of the proposed algorithm, the transition from inter-well to intra-well motion is clearly resolved for buckling NEMS imaged under SEM.

Course

Other identifiers

Book Title

Keywords

Degree Discipline

Degree Level

Degree Name

Citation

Published Version (Please cite this version)