Controlled growth and characterization of epitaxially-laterally-overgrown InGaN/GaN quantum heterostructures
buir.contributor.orcid | Demir, Hilmi Volkan|0000-0003-1793-112X | |
dc.citation.epage | 290 | en_US |
dc.citation.spage | 289 | en_US |
dc.contributor.author | Sarı, Emre | en_US |
dc.contributor.author | Akyuz, Özgün | en_US |
dc.contributor.author | Choi, E. -G. | en_US |
dc.contributor.author | Lee I.-H. | en_US |
dc.contributor.author | Baek J.H. | en_US |
dc.contributor.author | Demir, Hilmi Volkan | en_US |
dc.coverage.spatial | Denver, CO, USA | en_US |
dc.date.accessioned | 2016-02-08T12:22:22Z | |
dc.date.available | 2016-02-08T12:22:22Z | |
dc.date.issued | 2010 | en_US |
dc.department | Department of Electrical and Electronics Engineering | en_US |
dc.department | Institute of Materials Science and Nanotechnology (UNAM) | en_US |
dc.description | Date of Conference: 7-11 Nov. 2010 | en_US |
dc.description.abstract | Crystal material quality is fundamentally important for optoelectronic devices including laser diodes and light emitting diodes. To this end epitaxial lateral overgrowth (ELO) has proven to be a powerful technique for reducing dislocation density in GaN and its alloys [1,2]. Implementation and design of ELO process is, however, critical for obtaining high-quality material with high-efficiency quantum structures for light emitters [3]. ©2010 IEEE. | en_US |
dc.description.provenance | Made available in DSpace on 2016-02-08T12:22:22Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2010 | en |
dc.identifier.doi | 10.1109/PHOTONICS.2010.5698873 | en_US |
dc.identifier.uri | http://hdl.handle.net/11693/28501 | |
dc.language.iso | English | en_US |
dc.publisher | IEEE | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1109/PHOTONICS.2010.5698873 | en_US |
dc.source.title | 2010 23rd Annual Meeting of the IEEE Photonics Society | en_US |
dc.subject | Controlled growth | en_US |
dc.subject | Crystal material | en_US |
dc.subject | Dislocation densities | en_US |
dc.subject | Epitaxial lateral overgrowth | en_US |
dc.subject | High efficiency | en_US |
dc.subject | High-quality materials | en_US |
dc.subject | InGaN/GaN | en_US |
dc.subject | Laser diodes | en_US |
dc.subject | Light emitters | en_US |
dc.subject | Quantum heterostructures | en_US |
dc.subject | Quantum structure | en_US |
dc.subject | Dislocations (crystals) | en_US |
dc.subject | Gallium alloys | en_US |
dc.subject | Gallium nitride | en_US |
dc.subject | Light emission | en_US |
dc.subject | Light emitting diodes | en_US |
dc.subject | Optoelectronic devices | en_US |
dc.subject | Epitaxial growth | en_US |
dc.title | Controlled growth and characterization of epitaxially-laterally-overgrown InGaN/GaN quantum heterostructures | en_US |
dc.type | Conference Paper | en_US |
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