High efficiency monolithic photodetectors for integrated optoelectronics in the near infrared

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Abstract

Monolithic Germanium photodetectors integrated on Si with external efficiency up to 68% at 1550nm and low dark current density 3.2mA/cm2 are demonstrated. The absorption edge red shifted by 47nm corresponding to bandgap energy reduced by 24meV. © 2009 IEEE.

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2009 IEEE LEOS Annual Meeting Conference Proceedings

Publisher

IEEE

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Citation

Published Version (Please cite this version)

Language

English