Artifacts related to tip asymmetry in high-resolution atomic force microscopy and scanning tunneling microscopy measurements of graphitic surfaces

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dc.citation.epage031802-6en_US
dc.citation.issueNumber3en_US
dc.citation.spage31802en_US
dc.citation.volumeNumber33en_US
dc.contributor.authorUluutku, B.en_US
dc.contributor.authorBaykara, M. Z.en_US
dc.date.accessioned2016-02-08T09:54:34Z
dc.date.available2016-02-08T09:54:34Z
dc.date.issued2015en_US
dc.departmentDepartment of Mechanical Engineeringen_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.description.abstractThe effect of tip asymmetry on atomic-resolution scanning tunneling microscopy and atomic force microscopy measurements of graphitic surfaces has been investigated via numerical simulations. Employing a three-dimensional, crystalline, metallic tip apex and a two-layer thick graphene sample as a model system, basic calculations of the tip-sample interaction have revealed a significant effect of tip asymmetry on obtained results, including artificial modulation of site-specific chemical interaction forces and spatial distortion of observed features. Related artifacts are shown to be enhanced for tips with low lateral stiffness values. Our results emphasize that potentially erroneous interpretations of atomic-scale surface properties via imaging and spectroscopy measurements can be caused or enhanced by tip asymmetry.en_US
dc.identifier.doi10.1116/1.4915898en_US
dc.identifier.issn2166-2746
dc.identifier.urihttp://hdl.handle.net/11693/22037
dc.language.isoEnglishen_US
dc.publisherAmerican Institute of Physics Inc.en_US
dc.relation.isversionofhttp://dx.doi.org/10.1116/1.4915898en_US
dc.source.titleJournal of Vacuum Science and Technology. Part B. Nanotechnology & Microelectronicsen_US
dc.subjectScanning tunneling microscopyen_US
dc.subjectArtificial modulationen_US
dc.subjectChemical interactionsen_US
dc.subjectHigh resolutionen_US
dc.subjectLateral stiffnessen_US
dc.subjectMeasurements ofen_US
dc.subjectSpatial distortionen_US
dc.subjectSpectroscopy measurementsen_US
dc.subjectTip-sample interactionen_US
dc.subjectAtomic force microscopyen_US
dc.titleArtifacts related to tip asymmetry in high-resolution atomic force microscopy and scanning tunneling microscopy measurements of graphitic surfacesen_US
dc.typeArticleen_US
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