Thermal conductivity measurements via the bolometric effect
| buir.contributor.author | Kasırga, T. Serkan | |
| dc.citation.epage | 50 | en_US |
| dc.citation.spage | 29 | en_US |
| dc.contributor.author | Kasırga, T. Serkan | |
| dc.date.accessioned | 2021-03-04T13:22:03Z | |
| dc.date.available | 2021-03-04T13:22:03Z | |
| dc.date.issued | 2020 | |
| dc.department | Department of Physics | en_US |
| dc.department | Institute of Materials Science and Nanotechnology (UNAM) | en_US |
| dc.description | Chapter 3 | en_US |
| dc.description.abstract | In this chapter I will introduce the measurement of thermal conductivity using the bolometric effect. The bolometric effect is defined as the resistivity change of a material due to heating. Indeed, the bolometric effect forms the basis of many modern technological sensors and devices. For instance, most commonly used integrated circuit thermometers are based on the well calibrated resistivity change of a Pt strip. Another example is the thermal imaging sensors. A cooled array of high temperature coefficient of resistance material can sensitively detect the infrared spectrum due to the change in the electrical resistance of the active material. | en_US |
| dc.identifier.doi | 10.1007/978-981-15-5348-6_3 | en_US |
| dc.identifier.doi | 10.1007/978-981-15-5348-6 | en_US |
| dc.identifier.eisbn | 9789811553486 | |
| dc.identifier.eissn | 2191-5318 | |
| dc.identifier.isbn | 9789811553479 | |
| dc.identifier.issn | 2191-530X | |
| dc.identifier.uri | http://hdl.handle.net/11693/75786 | |
| dc.language.iso | English | en_US |
| dc.publisher | Springer | en_US |
| dc.relation.ispartof | Thermal conductivity measurements in atomically thin materials and devices | en_US |
| dc.relation.ispartofseries | SpringerBriefs in Applied Sciences and Technology | |
| dc.relation.isversionof | https://dx.doi.org/10.1007/978-981-15-5348-6_3 | en_US |
| dc.relation.isversionof | https://doi.org/10.1007/978-981-15-5348-6 | en_US |
| dc.source.title | SpringerBriefs in Applied Sciences and Technology | en_US |
| dc.subject | Bolometric thermal conductivity measurement method | en_US |
| dc.subject | Thermal conductivity in metallic 2D materials | en_US |
| dc.subject | Scanning photocurrent microscopy | en_US |
| dc.subject | Thermal conductivity measurements in 1D | en_US |
| dc.title | Thermal conductivity measurements via the bolometric effect | en_US |
| dc.type | Book Chapter | en_US |