Noncontact atomic force microscopy III

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dc.citation.epage947en_US
dc.citation.issueNumber1en_US
dc.citation.spage946en_US
dc.citation.volumeNumber7en_US
dc.contributor.authorBaykara, M. Z.en_US
dc.contributor.authorSchwarz, U. D.en_US
dc.date.accessioned2018-04-12T13:43:02Z
dc.date.available2018-04-12T13:43:02Z
dc.date.issued2016-06en_US
dc.departmentDepartment of Mechanical Engineeringen_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.identifier.doi10.3762/bjnano.7.86en_US
dc.identifier.issn2190-4286
dc.identifier.urihttp://hdl.handle.net/11693/38018
dc.language.isoEnglishen_US
dc.publisherBeilstein-Institut Zur Forderung der Chemischen Wissenschaftenen_US
dc.relation.isversionofhttps://doi.org/10.3762/bjnano.7.86en_US
dc.source.titleBeilstein Journal of Nanotechnologyen_US
dc.subjectAtomic force microscopyen_US
dc.subjectScanning force microscopyen_US
dc.titleNoncontact atomic force microscopy IIIen_US
dc.typeEditorialen_US

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