Contact imaging in the atomic force microscope using a higher order flexural mode combined with a new sensor

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buir.contributor.orcidAtalar, Abdullah|0000-0002-1903-1240
dc.citation.epage1429en_US
dc.citation.issueNumber10en_US
dc.citation.spage1427en_US
dc.citation.volumeNumber68en_US
dc.contributor.authorMinne, S. C.en_US
dc.contributor.authorManalis, S. R.en_US
dc.contributor.authorAtalar, Abdullahen_US
dc.contributor.authorQuate, C. F.en_US
dc.date.accessioned2015-07-28T11:56:00Z
dc.date.available2015-07-28T11:56:00Z
dc.date.issued1996-01en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.description.abstractUsing an atomic force microscope (AFM) with a silicon cantilever partially covered with a layer of zinc oxide (ZnO), we have imaged in the constant force mode by employing the ZnO as both a sensor and actuator. The cantilever deflection is determined by driving the ZnO at the second mechanical resonance while the tip is in contact with the sample. As the tipā€sample force varies, the mechanical boundary condition of the oscillating cantilever is altered, and the ZnO electrical admittance is changed. Constant force is obtained by offsetting the ZnO drive so that the admittance remains constant. We have also used the ZnO as an actuator and sensor for imaging in the intermittent contact mode. In both modes, images produced by using the ZnO as a sensor are compared to images acquired with a piezoresistive sensor.en_US
dc.identifier.doi10.1063/1.116102en_US
dc.identifier.eissn1077-3118
dc.identifier.issn0003-6951
dc.identifier.urihttp://hdl.handle.net/11693/10827
dc.language.isoEnglishen_US
dc.publisherA I P Publishing LLCen_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.116102en_US
dc.source.titleApplied Physics Lettersen_US
dc.subjectChemical elementsen_US
dc.subjectElectric measurementsen_US
dc.subjectPiezoresistanceen_US
dc.subjectStructural vibrationsen_US
dc.subjectMetal oxidesen_US
dc.titleContact imaging in the atomic force microscope using a higher order flexural mode combined with a new sensoren_US
dc.typeArticleen_US

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Department of Electrical and Electronics Engineering
Institute of Materials Science and Nanotechnology (UNAM)