Two-dimensional x-ray photoelectron spectroscopy for composite surface analysis

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buir.contributor.authorSüzer, Şefik
dc.citation.epage3936en_US
dc.citation.issueNumber10en_US
dc.citation.spage3931en_US
dc.citation.volumeNumber80en_US
dc.contributor.authorSüzer, Şefiken_US
dc.contributor.authorSezen, H.en_US
dc.contributor.authorDâna, A.en_US
dc.date.accessioned2016-02-08T10:09:13Z
dc.date.available2016-02-08T10:09:13Z
dc.date.issued2008en_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.departmentDepartment of Chemistryen_US
dc.departmentDepartment of Physicsen_US
dc.description.abstractWe describe a method for obtaining two-dimensional X-ray photoelectron spectroscopic data derived from the frequency dependence of the XPS peaks recorded under electrical square-wave pulses, which control and affect the binding energy positions via the electrical potentials developed as a result of charging. By using cross-correlations between various peaks, our technique enables us to elucidate electrical characteristics of surface structures of composite samples and bring out various correlations between hidden/overlapping peaks. © 2008 American Chemical Society.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T10:09:13Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2008en
dc.identifier.doi10.1021/ac702642wen_US
dc.identifier.issn0003-2700
dc.identifier.urihttp://hdl.handle.net/11693/23120
dc.language.isoEnglishen_US
dc.relation.isversionofhttp://dx.doi.org/10.1021/ac702642wen_US
dc.source.titleAnalytical Chemistryen_US
dc.subjectBinding energyen_US
dc.subjectComposite materialsen_US
dc.subjectCorrelation methodsen_US
dc.subjectElectric potentialen_US
dc.subjectTwo dimensionalen_US
dc.subjectX ray photoelectron spectroscopyen_US
dc.subjectBinding energy positionsen_US
dc.subjectComposite surfacesen_US
dc.subjectFrequency dependenceen_US
dc.subjectSurface structureen_US
dc.titleTwo-dimensional x-ray photoelectron spectroscopy for composite surface analysisen_US
dc.typeArticleen_US

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