Two-dimensional x-ray photoelectron spectroscopy for composite surface analysis
Date
2008
Authors
Editor(s)
Advisor
Supervisor
Co-Advisor
Co-Supervisor
Instructor
Source Title
Analytical Chemistry
Print ISSN
0003-2700
Electronic ISSN
Publisher
Volume
80
Issue
10
Pages
3931 - 3936
Language
English
Type
Journal Title
Journal ISSN
Volume Title
Series
Abstract
We describe a method for obtaining two-dimensional X-ray photoelectron spectroscopic data derived from the frequency dependence of the XPS peaks recorded under electrical square-wave pulses, which control and affect the binding energy positions via the electrical potentials developed as a result of charging. By using cross-correlations between various peaks, our technique enables us to elucidate electrical characteristics of surface structures of composite samples and bring out various correlations between hidden/overlapping peaks. © 2008 American Chemical Society.