Two-dimensional x-ray photoelectron spectroscopy for composite surface analysis

Date
2008
Advisor
Instructor
Source Title
Analytical Chemistry
Print ISSN
0003-2700
Electronic ISSN
Publisher
Volume
80
Issue
10
Pages
3931 - 3936
Language
English
Type
Article
Journal Title
Journal ISSN
Volume Title
Abstract

We describe a method for obtaining two-dimensional X-ray photoelectron spectroscopic data derived from the frequency dependence of the XPS peaks recorded under electrical square-wave pulses, which control and affect the binding energy positions via the electrical potentials developed as a result of charging. By using cross-correlations between various peaks, our technique enables us to elucidate electrical characteristics of surface structures of composite samples and bring out various correlations between hidden/overlapping peaks. © 2008 American Chemical Society.

Course
Other identifiers
Book Title
Keywords
Binding energy, Composite materials, Correlation methods, Electric potential, Two dimensional, X ray photoelectron spectroscopy, Binding energy positions, Composite surfaces, Frequency dependence, Surface structure
Citation
Published Version (Please cite this version)