Verification of impedance matching at the surface of left-handed materials

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buir.contributor.orcidÖzbay, Ekmel|0000-0003-2953-1828
dc.citation.epage2552en_US
dc.citation.issueNumber12en_US
dc.citation.spage2548en_US
dc.citation.volumeNumber48en_US
dc.contributor.authorAydın, Korayen_US
dc.contributor.authorBulu, İrfanen_US
dc.contributor.authorÖzbay, Ekmelen_US
dc.date.accessioned2016-02-08T11:47:27Z
dc.date.available2016-02-08T11:47:27Z
dc.date.issued2006en_US
dc.departmentDepartment of Physicsen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.description.abstractImpedance matching at the surface of left-handed materials (LHM) is required for certain applications including a perfect lens. In this study, we present the experimental and theoretical verification of an impedance-matched LHM to free space. Reflection characteristics of both one-dimensional and two-dimensional LHM were investigated. The reflection was observed to be very low at a narrow frequency range. FDTD simulations and retrieval procedures were used to theoretically verify impedance matching. By varying the number of layers along the propagation direction, the ultralow reflection at specific frequencies was shown to be independent of the sample thickness. © 2006 Wiley Periodicals, Inc.en_US
dc.identifier.doi10.1002/mop.22003en_US
dc.identifier.issn0895-2477
dc.identifier.urihttp://hdl.handle.net/11693/27204
dc.language.isoEnglishen_US
dc.publisherWileyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1002/mop.22003en_US
dc.source.titleMicrowave and Optical Technology Lettersen_US
dc.subjectImpedance matchingen_US
dc.subjectLeft-handed materialsen_US
dc.subjectMetamaterialsen_US
dc.subjectPerfect lensen_US
dc.subjectReflectionen_US
dc.subjectComputer simulationen_US
dc.subjectElectromagnetic wave reflectionen_US
dc.subjectFinite difference methoden_US
dc.subjectLensesen_US
dc.subjectNatural frequenciesen_US
dc.subjectTime domain analysisen_US
dc.subjectWave propagationen_US
dc.subjectFDTD simulationsen_US
dc.titleVerification of impedance matching at the surface of left-handed materialsen_US
dc.typeArticleen_US

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Department of Physics
Department of Electrical and Electronics Engineering
Institute of Materials Science and Nanotechnology (UNAM)