Verification of impedance matching at the surface of left-handed materials
Date
2006
Authors
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Source Title
Microwave and Optical Technology Letters
Print ISSN
0895-2477
Electronic ISSN
Publisher
Wiley
Volume
48
Issue
12
Pages
2548 - 2552
Language
English
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Abstract
Impedance matching at the surface of left-handed materials (LHM) is required for certain applications including a perfect lens. In this study, we present the experimental and theoretical verification of an impedance-matched LHM to free space. Reflection characteristics of both one-dimensional and two-dimensional LHM were investigated. The reflection was observed to be very low at a narrow frequency range. FDTD simulations and retrieval procedures were used to theoretically verify impedance matching. By varying the number of layers along the propagation direction, the ultralow reflection at specific frequencies was shown to be independent of the sample thickness. © 2006 Wiley Periodicals, Inc.