Nanomechanical characterization by double-pass force-distance mapping
| buir.contributor.author | Dagdas, Yavuz S. | |
| buir.contributor.author | Tekinay, Ayse B. | |
| buir.contributor.author | Güler, Mustafa O. | |
| buir.contributor.author | Dâna, Aykutlu | |
| dc.citation.epage | 295704-5 | en_US |
| dc.citation.issueNumber | 29 | en_US |
| dc.citation.spage | 295704-1 | en_US |
| dc.citation.volumeNumber | 22 | en_US |
| dc.contributor.author | Dagdas, Yavuz S. | en_US |
| dc.contributor.author | Aslan, M. N. | en_US |
| dc.contributor.author | Tekinay, Ayse B. | en_US |
| dc.contributor.author | Güler, Mustafa O. | en_US |
| dc.contributor.author | Dâna, Aykutlu | en_US |
| dc.date.accessioned | 2016-02-08T09:51:57Z | |
| dc.date.available | 2016-02-08T09:51:57Z | |
| dc.date.issued | 2011 | en_US |
| dc.department | Institute of Materials Science and Nanotechnology (UNAM) | en_US |
| dc.department | Aysel Sabuncu Brain Research Center (BAM) | en_US |
| dc.description.abstract | We demonstrate high speed force-distance mapping using a double-pass scheme. The topography is measured in tapping mode in the first pass and this information is used in the second pass to move the tip over the sample. In the second pass, the cantilever dither signal is turned off and the sample is vibrated. Rapid (few kHz frequency) force-distance curves can be recorded with small peak interaction force, and can be processed into an image. Such a double-pass measurement eliminates the need for feedback during force-distance measurements. The method is demonstrated on self-assembled peptidic nanofibers. © 2011 IOP Publishing Ltd. | en_US |
| dc.description.provenance | Made available in DSpace on 2016-02-08T09:51:57Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2011 | en |
| dc.identifier.doi | 10.1088/0957-4484/22/29/295704 | en_US |
| dc.identifier.eissn | 1361-6528 | |
| dc.identifier.issn | 0957-4484 | |
| dc.identifier.uri | http://hdl.handle.net/11693/21851 | |
| dc.language.iso | English | en_US |
| dc.publisher | Institute of Physics Publishing | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1088/0957-4484/22/29/295704 | en_US |
| dc.source.title | Nanotechnology | en_US |
| dc.title | Nanomechanical characterization by double-pass force-distance mapping | en_US |
| dc.type | Article | en_US |
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