Nanomechanical characterization by double-pass force-distance mapping

Date
2011
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Source Title
Nanotechnology
Print ISSN
0957-4484
Electronic ISSN
1361-6528
Publisher
Institute of Physics Publishing
Volume
22
Issue
29
Pages
295704-1 - 295704-5
Language
English
Type
Article
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Abstract

We demonstrate high speed force-distance mapping using a double-pass scheme. The topography is measured in tapping mode in the first pass and this information is used in the second pass to move the tip over the sample. In the second pass, the cantilever dither signal is turned off and the sample is vibrated. Rapid (few kHz frequency) force-distance curves can be recorded with small peak interaction force, and can be processed into an image. Such a double-pass measurement eliminates the need for feedback during force-distance measurements. The method is demonstrated on self-assembled peptidic nanofibers. © 2011 IOP Publishing Ltd.

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Published Version (Please cite this version)