Experimental evaluation of impact ionization coefficients in Al xGa1-xN based avalanche photodiodes

Date

2006

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Source Title

Applied Physics Letters

Print ISSN

0003-6951

Electronic ISSN

1077-3118

Publisher

AIP Publishing LLC

Volume

89

Issue

18

Pages

183524-1 - 183524-3

Language

English

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Abstract

The authors report on the metal-organic chemical vapor deposition growth, fabrication, and characterization of high performance solar-blind avalanche photodetectors and the experimental evaluation of the impact ionization coefficients that are obtained from the photomultiplication data. A Schottky barrier, suitable for back and front illuminations, is used to determine the impact ionization coefficients of electrons and holes in an AlGaN based avalanche photodiode. © 2006 American Institute of Physics.

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