On-chip integrated nanowire devices with controllable nanogap for manipulation, capturing, and electrical characterization of nanoparticles

Date
2009
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Source Title
2009 IEEE LEOS Annual Meeting Conference Proceedings
Print ISSN
1092-8081
Electronic ISSN
Publisher
IEEE
Volume
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Pages
217 - 218
Language
English
Type
Conference Paper
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Abstract

Dielectrophoresis (DEP) allows for electric field assisted assembly in spatially non-uniform field distribution, where the induced moment is translated into a net force on polarized particles towards the high field gradient. For example, for a spherical particle of radius r with a permittivity constant ofεp in a host medium with the permittivity ofε m, the dielectrophoretic force is given by (1): where r is the particle radius, ω is the angular frequency and Erms is the root mean square electric field. K is the Clausius-Mossotti function, which depends on the complex permittivity of the spherical particle and the medium [1].IEEE.

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Keywords
Angular frequencies, Complex permittivity, Dielectrophoresis, Dielectrophoretic forces, Electrical characterization, High field, Host mediums, Nano-gap, Nanowire devices, Nonuniform field, On chips, Permittivity constant, Polarized particles, Root Mean square, Spherical particle, Dielectric devices, Electric fields, Electrophoresis, Permittivity
Citation
Published Version (Please cite this version)