Improved InGaN/GaN light-emitting diodes with a p-GaN/n-GaN/p-GaN/n-GaN/p-GaN current-spreading layer
Date
2013
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Source Title
Optics Express
Print ISSN
10944087
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Publisher
Optical Society of American (OSA)
Volume
21
Issue
4
Pages
4958 - 4969
Language
English
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Abstract
This work reports both experimental and theoretical studies on the InGaN/GaN light-emitting diodes (LEDs) with optical output power and external quantum efficiency (EQE) levels substantially enhanced by incorporating p-GaN/n-GaN/p-GaN/n-GaN/p-GaN (PNPNP-GaN) current spreading layers in p-GaN. Each thin n-GaN layer sandwiched in the PNPNP-GaN structure is completely depleted due to the built-in electric field in the PNPNP-GaN junctions, and the ionized donors in these n-GaN layers serve as the hole spreaders. As a result, the electrical performance of the proposed device is improved and the optical output power and EQE are enhanced. © 2013 Optical Society of America.
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Keywords
Gallium nitride , Built-in electric fields , Current spreading , Electrical performance , External quantum efficiency , InGaN/GaN , Ingan/gan lightemitting diodes (LEDs) , Ionized donors , Optical output power , Theoretical study , Light emitting diodes , gallium , gallium nitride , indium , indium nitride , gallium , indium , chemistry , device failure analysis , devices , electric conductivity , equipment design , illumination , semiconductor , article , chemistry , equipment , equipment failure , illumination , Electric Conductivity , Equipment Design , Equipment Failure Analysis , Gallium , Indium , Lighting , Semiconductors , Electric Conductivity , Equipment Design , Equipment Failure Analysis , Gallium , Indium , Lighting , Semiconductors