Browsing by Subject "Short-range forces"

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    Measurement of energy dissipation between tungsten tip and Si(1 0 0)-(2×1) using sub-Ångström oscillation amplitude non-contact atomic force microscope
    (Elsevier Science B.V., 2003) Özer, H. Ö.; Atabak, M.; Oral, A.
    Energy dissipation plays an important role in non-contact atomic force microscopy (nc-AFM), atomic manipulation and friction. In this work, we studied atomic scale energy dissipation between a tungsten tip and Si(1 0 0)-(2 x 1) surface. Dissipation measurements are performed with a high sensitivity nc-AFM using sub-Angstrom oscillation amplitudes below resonance. We observed an increase in the dissipation as the tip is approached closer to the surface, followed by an unexpected decrease as we pass the inflection point in the energy-distance curve. This dissipation is most probably due to transformation of the kinetic energy of the tip into phonons and heat.
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    ItemOpen Access
    Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes
    (Elsevier Science B.V., 2002) Özer, H. Ö.; Atabak, M.; Ellialtoğlu, R. M.; Oral, A.
    Si(1 0 0)(2 × 1) surface is imaged using a new non-contact atomic force microscopy (nc-AFM)/STM with sub-Ångström oscillation amplitudes using stiff tungsten levers. Simultaneous force gradient and STM images of individual dimers and atomic scale defects are obtained. We measured force-distance (f-d) curves with different tips. Some of the tips show long force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM.