Measurement of energy dissipation between tungsten tip and Si(1 0 0)-(2×1) using sub-Ångström oscillation amplitude non-contact atomic force microscope
Date
2003
Authors
Özer, H. Ö.
Atabak, M.
Oral, A.
Editor(s)
Advisor
Supervisor
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Co-Supervisor
Instructor
Source Title
Applied Surface Science
Print ISSN
0169-4332
Electronic ISSN
Publisher
Elsevier Science B.V.
Volume
210
Issue
2
Pages
12 - 17
Language
English
Type
Journal Title
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Abstract
Energy dissipation plays an important role in non-contact atomic force microscopy (nc-AFM), atomic manipulation and friction. In this work, we studied atomic scale energy dissipation between a tungsten tip and Si(1 0 0)-(2 x 1) surface. Dissipation measurements are performed with a high sensitivity nc-AFM using sub-Angstrom oscillation amplitudes below resonance. We observed an increase in the dissipation as the tip is approached closer to the surface, followed by an unexpected decrease as we pass the inflection point in the energy-distance curve. This dissipation is most probably due to transformation of the kinetic energy of the tip into phonons and heat.