Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes

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Simultaneous non-contact atomic force microscopy (nc-AFM) STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes.pdf (221.29 KB)

Date

2002

Authors

Özer, H. Ö.
Atabak, M.
Ellialtoğlu, R. M.
Oral, A.

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Source Title

Applied Surface Science

Print ISSN

0169-4332

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Publisher

Elsevier Science B.V.

Volume

188

Issue

3-4

Pages

301 - 305

Language

English

Type

Article

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Abstract

Si(1 0 0)(2 × 1) surface is imaged using a new non-contact atomic force microscopy (nc-AFM)/STM with sub-Ångström oscillation amplitudes using stiff tungsten levers. Simultaneous force gradient and STM images of individual dimers and atomic scale defects are obtained. We measured force-distance (f-d) curves with different tips. Some of the tips show long force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM.

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Keywords

Force-distance spectroscopy, Non-contact atomic force microscopy, Short-range forces, Si(1 0 0)(2 × 1), Small oscillation amplitudes, Atomic force microscopy, Imaging techniques, Oscillations, Scanning tunneling microscopy, Surfaces, Oscillation amplitudes, Semiconducting silicon

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Permalink

http://hdl.handle.net/11693/27576

Published Version (Please cite this version)

http://dx.doi.org/10.1016/S0169-4332(01)00942-4

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Scholarly Publications - Physics