Dynamical XPS measurements for probing photoinduced voltage changes

dc.citation.epageL62en_US
dc.citation.issueNumber21-22en_US
dc.citation.spageL59en_US
dc.citation.volumeNumber604en_US
dc.contributor.authorSezen, H.en_US
dc.contributor.authorSüzer, Şefiken_US
dc.contributor.bilkentauthorSüzer, Şefik
dc.date.accessioned2016-02-08T09:56:50Z
dc.date.available2016-02-08T09:56:50Z
dc.date.issued2010en_US
dc.departmentDepartment of Chemistryen_US
dc.description.abstractPhotoillumination with 405 nm laser causes shifts in XPS peaks of n-Si(100), and CdS. To distinguish between surface photovoltage (SPV), and charging, dynamical measurements are performed, while sample is subjected to square wave pulses of ± 10.00 V amplitude, and 10-3-10 5 Hz frequency. For n-Si, Si2p peaks are twinned at + 10.00 and -10.00, yielding always 20.00 eV difference. Photoillumination shifts the twinned peaks to higher energies, but the difference is always 20.00 eV. However, for CdS, the measured binding difference of Cd3d peaks exhibits strong frequency dependence due to charging, which indicates that both fast SPV and slow charging effects are operative.en_US
dc.identifier.doi10.1016/j.susc.2010.08.001en_US
dc.identifier.issn0039-6028
dc.identifier.urihttp://hdl.handle.net/11693/22201
dc.language.isoEnglishen_US
dc.relation.isversionofhttp://dx.doi.org/10.1016/j.susc.2010.08.001en_US
dc.source.titleSurface Scienceen_US
dc.subjectChargingen_US
dc.subjectDynamical XPSen_US
dc.subjectPhotoconductivityen_US
dc.subjectPhotovoltageen_US
dc.subjectCdSen_US
dc.subjectCharging effecten_US
dc.subjectFrequency dependenceen_US
dc.subjectPhoto-induced voltageen_US
dc.subjectPhotoilluminationen_US
dc.subjectSi(100)en_US
dc.subjectSquare wavesen_US
dc.subjectSurface photovoltagesen_US
dc.subjectXPSen_US
dc.subjectXPS measurementsen_US
dc.subjectCadmium compoundsen_US
dc.subjectCadmium sulfideen_US
dc.subjectPhotoconductivityen_US
dc.subjectX ray photoelectron spectroscopyen_US
dc.titleDynamical XPS measurements for probing photoinduced voltage changesen_US
dc.typeArticleen_US
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