Dynamical XPS measurements for probing photoinduced voltage changes
Date
2010
Authors
Advisor
Instructor
Source Title
Surface Science
Print ISSN
0039-6028
Electronic ISSN
Publisher
Volume
604
Issue
21-22
Pages
L59 - L62
Language
English
Type
Article
Journal Title
Journal ISSN
Volume Title
Abstract
Photoillumination with 405 nm laser causes shifts in XPS peaks of n-Si(100), and CdS. To distinguish between surface photovoltage (SPV), and charging, dynamical measurements are performed, while sample is subjected to square wave pulses of ± 10.00 V amplitude, and 10-3-10 5 Hz frequency. For n-Si, Si2p peaks are twinned at + 10.00 and -10.00, yielding always 20.00 eV difference. Photoillumination shifts the twinned peaks to higher energies, but the difference is always 20.00 eV. However, for CdS, the measured binding difference of Cd3d peaks exhibits strong frequency dependence due to charging, which indicates that both fast SPV and slow charging effects are operative.
Course
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Book Title
Keywords
Charging, Dynamical XPS, Photoconductivity, Photovoltage, CdS, Charging effect, Frequency dependence, Photo-induced voltage, Photoillumination, Si(100), Square waves, Surface photovoltages, XPS, XPS measurements, Cadmium compounds, Cadmium sulfide, Photoconductivity, X ray photoelectron spectroscopy