Electromagnetic wave focusing from sources inside a two-dimensional left-handed material superlens

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buir.contributor.authorÖzbay, Ekmel
buir.contributor.orcidÖzbay, Ekmel|0000-0003-2953-1828
dc.citation.issueNumber221en_US
dc.citation.volumeNumber8en_US
dc.contributor.authorAydın, K.en_US
dc.contributor.authorBulu, I.en_US
dc.contributor.authorÖzbay, Ekmelen_US
dc.date.accessioned2016-02-08T10:17:52Z
dc.date.available2016-02-08T10:17:52Z
dc.date.issued2006en_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.departmentDepartment of Physicsen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.description.abstractLenses made of negative index materials exhibit different focusing behaviours compared to positive index material lenses. Flat lens behaviour and imaging below the diffraction limit is possible with negative refractive index lenses. In this study, we employed left-handed materials (LHM) as negative index materials and experimentally investigated the focusing behaviour of such lenses. A point source is embedded inside the LHM lens. We have shown that it is possible to focus electromagnetic (EM) waves by using a planar configuration of lenses that is constructed by using two-dimensional (2D) LHMs. Flat lens behaviour is observed at 3.89 GHz, where EM waves are focused along the lateral and longitudinal directions. At 3.77 GHz, where the reflection is measured to be minimum, the focusing effect occurred at the surface of the LHM with a spot size of 0.16λ. We were able to overcome the diffraction limit with a slab-shaped LHM superlens. © IOP Publishing Ltd. and Deutsche Physikalische Gesellschaft.en_US
dc.identifier.doi10.1088/1367-2630/8/10/221en_US
dc.identifier.issn1367-2630
dc.identifier.urihttp://hdl.handle.net/11693/23699
dc.language.isoEnglishen_US
dc.publisherInstitute of Physics Publishingen_US
dc.relation.isversionofhttp://dx.doi.org/10.1088/1367-2630/8/10/221en_US
dc.source.titleNew Journal of Physicsen_US
dc.subjectLeft-handed materialsen_US
dc.subjectNegative index materialsen_US
dc.subjectPlanar configurationen_US
dc.subjectSuperlensesen_US
dc.subjectElectron diffractionen_US
dc.subjectLensesen_US
dc.subjectRefractive indexen_US
dc.subjectSurface propertiesen_US
dc.subjectElectromagnetic wavesen_US
dc.titleElectromagnetic wave focusing from sources inside a two-dimensional left-handed material superlensen_US
dc.typeArticleen_US

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Institute of Materials Science and Nanotechnology (UNAM)
Department of Electrical and Electronics Engineering
Department of Physics