Characterisation of internal morphologies in electrospun fibers by X-ray tomographic microscopy

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buir.contributor.authorUyar, Tamer
buir.contributor.orcidUyar, Tamer|0000-0002-3989-4481
dc.citation.epage3597en_US
dc.citation.issueNumber9en_US
dc.citation.spage3594en_US
dc.citation.volumeNumber3en_US
dc.contributor.authorNygaard, J. V.en_US
dc.contributor.authorUyar, Tameren_US
dc.contributor.authorChen, M.en_US
dc.contributor.authorCloetens, P.en_US
dc.contributor.authorKingshott, P.en_US
dc.contributor.authorBesenbacher, F.en_US
dc.date.accessioned2016-02-08T09:51:07Z
dc.date.available2016-02-08T09:51:07Z
dc.date.issued2011en_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.description.abstractElectrospun fabrics for use in, for example, tissue engineering, wound dressings, textiles, filters and membranes have attracted a lot of attention due to their morphological nanoscale architectures which enhance their physical properties. A thorough detailed internal morphological study has been performed on electrospun polystyrene (PS) fibers produced from dimethylformamide (DMF) solutions. Investigations by transmission electron microscopy (TEM) and thorough studies for the first time by synchrotron based X-ray tomographic microscopy (XTM) revealed that the individual electrospun PS fibers and beads have a graded density and in some cases even an internal porous structure. © The Royal Society of Chemistry 2011.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T09:51:07Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2011en
dc.identifier.doi10.1039/c1nr10304ken_US
dc.identifier.issn2040-3364
dc.identifier.urihttp://hdl.handle.net/11693/21786
dc.language.isoEnglishen_US
dc.publisherRoyal Society of Chemistryen_US
dc.relation.isversionofhttp://dx.doi.org/10.1039/c1nr10304ken_US
dc.source.titleNanoscaleen_US
dc.titleCharacterisation of internal morphologies in electrospun fibers by X-ray tomographic microscopyen_US
dc.typeArticleen_US

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