Measurement of energy dissipation between tungsten tip and Si(1 0 0)-(2×1) using sub-Ångström oscillation amplitude non-contact atomic force microscope

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dc.citation.epage17en_US
dc.citation.issueNumber2en_US
dc.citation.spage12en_US
dc.citation.volumeNumber210en_US
dc.contributor.authorÖzer, H. Ö.en_US
dc.contributor.authorAtabak, M.en_US
dc.contributor.authorOral, A.en_US
dc.date.accessioned2015-07-28T11:57:19Z
dc.date.available2015-07-28T11:57:19Z
dc.date.issued2003en_US
dc.departmentDepartment of Physicsen_US
dc.description.abstractEnergy dissipation plays an important role in non-contact atomic force microscopy (nc-AFM), atomic manipulation and friction. In this work, we studied atomic scale energy dissipation between a tungsten tip and Si(1 0 0)-(2 x 1) surface. Dissipation measurements are performed with a high sensitivity nc-AFM using sub-Angstrom oscillation amplitudes below resonance. We observed an increase in the dissipation as the tip is approached closer to the surface, followed by an unexpected decrease as we pass the inflection point in the energy-distance curve. This dissipation is most probably due to transformation of the kinetic energy of the tip into phonons and heat.en_US
dc.identifier.doi10.1016/S0169-4332(02)01472-1en_US
dc.identifier.issn0169-4332
dc.identifier.urihttp://hdl.handle.net/11693/11283
dc.language.isoEnglishen_US
dc.publisherElsevier Science B.V.en_US
dc.relation.isversionofhttp://dx.doi.org/10.1016/S0169-4332(02)01472-1en_US
dc.source.titleApplied Surface Scienceen_US
dc.subjectNon-contact atomic force microscopyen_US
dc.subjectSmall oscillation amplitudesen_US
dc.subjectSi(100)-(2 X 1)en_US
dc.subjectForce-distance spectroscopyen_US
dc.subjectDissipation-distance spectroscopyen_US
dc.subjectShort-range forcesen_US
dc.subjectAtomic scale dissipationen_US
dc.titleMeasurement of energy dissipation between tungsten tip and Si(1 0 0)-(2×1) using sub-Ångström oscillation amplitude non-contact atomic force microscopeen_US
dc.typeArticleen_US

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