High-speed solar-blind photodetectors with indium-tin-oxide Schottky contacts
buir.contributor.author | Özbay, Ekmel | |
buir.contributor.author | Bıyıklı, Necmi | |
buir.contributor.orcid | Özbay, Ekmel|0000-0003-2953-1828 | |
dc.citation.epage | 2346 | en_US |
dc.citation.issueNumber | 14 | en_US |
dc.citation.spage | 2344 | en_US |
dc.citation.volumeNumber | 82 | en_US |
dc.contributor.author | Bıyıklı, Necmi | en_US |
dc.contributor.author | Kimukin, I. | en_US |
dc.contributor.author | Kartaloglu, T. | en_US |
dc.contributor.author | Aytur, O. | en_US |
dc.contributor.author | Özbay, Ekmel | en_US |
dc.date.accessioned | 2016-02-08T10:30:17Z | |
dc.date.available | 2016-02-08T10:30:17Z | |
dc.date.issued | 2003 | en_US |
dc.department | Department of Electrical and Electronics Engineering | en_US |
dc.department | Department of Physics | en_US |
dc.description.abstract | AlGaN/GaN-based high-speed solar-blind photodetectors were discussed. Current-voltage, spectral responsivity, and high-frequency response characterizations were performed. Breakdown voltages larger than 40 V were obtained. A maximum responsivity of 44 mA/W at 263 nm was measured. True solar-blind detection was also ensured. | en_US |
dc.identifier.doi | 10.1063/1.1566459 | en_US |
dc.identifier.issn | 0003-6951 | |
dc.identifier.uri | http://hdl.handle.net/11693/24499 | |
dc.language.iso | English | en_US |
dc.publisher | American Institute of Physics | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1063/1.1566459 | en_US |
dc.source.title | Applied Physics Letters | en_US |
dc.subject | Bandwidth | en_US |
dc.subject | Current voltage characteristics | en_US |
dc.subject | Electric breakdown | en_US |
dc.subject | Electric contacts | en_US |
dc.subject | Quantum efficiency | en_US |
dc.subject | Semiconducting aluminum compounds | en_US |
dc.subject | Spectral responsivity | en_US |
dc.subject | Photodetectors | en_US |
dc.title | High-speed solar-blind photodetectors with indium-tin-oxide Schottky contacts | en_US |
dc.type | Article | en_US |
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