Perfectly absorbing ultra thin interference coatings for hydrogen sensing

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buir.contributor.authorBıyıklı, Necmi
dc.citation.epage1727en_US
dc.citation.issueNumber8en_US
dc.citation.spage1724en_US
dc.citation.volumeNumber41en_US
dc.contributor.authorSerhatlioglu, M.en_US
dc.contributor.authorAyas S.en_US
dc.contributor.authorBıyıklı, Necmien_US
dc.contributor.authorDana, A.en_US
dc.contributor.authorSolmaz, M. E.en_US
dc.date.accessioned2018-04-12T10:55:14Z
dc.date.available2018-04-12T10:55:14Z
dc.date.issued2016en_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.description.abstractHere we numerically demonstrate a straightforward method for optical detection of hydrogen gas by means of absorption reduction and colorimetric indication. A perfectly absorbing metal-insulator-metal (MIM) thin film interference structure is constructed using a silver metal back reflector, silicon dioxide insulator, and palladium as the upper metal layer and hydrogen catalyst. The thickness of silicon dioxide allows the maximizing of the electric field intensity at the Air/SiO2 interface at the quarter wavelengths and enabling perfect absorption with the help of highly absorptive palladium thin film (∼7 nm). While the exposure of the MIM structure to H2 moderately increases reflection, the relative intensity contrast due to formation of metal hydride is extensive. By modifying the insulator film thickness and hence the spectral absorption, the color is tuned and eye-visible results are obtained.en_US
dc.description.provenanceMade available in DSpace on 2018-04-12T10:55:14Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 179475 bytes, checksum: ea0bedeb05ac9ccfb983c327e155f0c2 (MD5) Previous issue date: 2016en
dc.identifier.doi10.1364/OL.41.001724en_US
dc.identifier.issn0146-9592
dc.identifier.urihttp://hdl.handle.net/11693/36842
dc.language.isoEnglishen_US
dc.publisherOSA - The Optical Societyen_US
dc.relation.isversionofhttps://doi.org/10.1364/OL.41.001724en_US
dc.source.titleOptics Lettersen_US
dc.subjectElectric fieldsen_US
dc.subjectFilm thicknessen_US
dc.subjectHydridesen_US
dc.subjectInterfaces (materials)en_US
dc.subjectMetal insulator boundariesen_US
dc.subjectMetalsen_US
dc.subjectPalladiumen_US
dc.subjectPhase interfacesen_US
dc.subjectSilicaen_US
dc.subjectSilveren_US
dc.subjectThin filmsen_US
dc.subjectElectric field intensitiesen_US
dc.subjectHydrogen catalystsen_US
dc.subjectInterference coatingsen_US
dc.subjectMetal insulator metalsen_US
dc.subjectQuarter-wavelengthen_US
dc.subjectSpectral absorptionsen_US
dc.subjectStraight-forward methoden_US
dc.subjectThin-film interferenceen_US
dc.subjectMIM devicesen_US
dc.titlePerfectly absorbing ultra thin interference coatings for hydrogen sensingen_US
dc.typeArticleen_US

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