Resonant harmonic response in tapping-mode atomic force microscopy

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buir.contributor.orcidAtalar, Abdullah|0000-0002-1903-1240
dc.citation.epage165416-9en_US
dc.citation.issueNumber16en_US
dc.citation.spage165416-1en_US
dc.citation.volumeNumber69en_US
dc.contributor.authorSahin, O.en_US
dc.contributor.authorQuate, C. F.en_US
dc.contributor.authorSolgaard, O.en_US
dc.contributor.authorAtalar, Abdullahen_US
dc.date.accessioned2016-02-08T10:27:15Z
dc.date.available2016-02-08T10:27:15Z
dc.date.issued2004en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.description.abstractHigher harmonics in tapping-mode atomic force microscopy offers the potential for imaging and sensing material properties at the nanoscale. The signal level at a given harmonic of the fundamental mode can be enhanced if the cantilever is designed in such a way that the frequency of one of the higher harmonics of the fundamental mode (designated as the resonant harmonic) matches the resonant frequency of a higher-order flexural mode. Here we present an analytical approach that relates the amplitude and phase of the cantilever vibration at the frequency of the resonant harmonic to the elastic modulus of the sample. The resonant harmonic response is optimized for different samples with a proper design of the cantilever. It is found that resonant harmonics are sensitive to the stiffness of the material under investigation.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T10:27:15Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2004en
dc.identifier.doi10.1103/PhysRevB.69.165416en_US
dc.identifier.eissn0163-1829
dc.identifier.issn2469-9950
dc.identifier.urihttp://hdl.handle.net/11693/24298
dc.language.isoEnglishen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevB.69.165416en_US
dc.source.titlePhysical Review B (Condensed Matter)en_US
dc.source.titlePhysical Review B: covering condensed matter and materials physicsen_US
dc.subjectAmplitude modulationen_US
dc.subjectAtomic force microscopyen_US
dc.subjectImagingen_US
dc.subjectMathematical analysisen_US
dc.subjectNanoparticleen_US
dc.subjectRemote sensingen_US
dc.subjectVibrationen_US
dc.titleResonant harmonic response in tapping-mode atomic force microscopyen_US
dc.typeArticleen_US

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Department of Electrical and Electronics Engineering
Institute of Materials Science and Nanotechnology (UNAM)