Multi-section waveguide method for facet temperature reduction and improved reliability of high-power laser diodes

buir.contributor.orcidDemir, Abdullah|0000-0003-4678-0084en_US
dc.citation.epage9en_US
dc.citation.spage1en_US
dc.citation.volumeNumber12141en_US
dc.contributor.authorEbadi, Kaveh
dc.contributor.authorLiu, Yuxian
dc.contributor.authorSünnetçioğlu, Ali Kaan
dc.contributor.authorGündoğdu, Sinan
dc.contributor.authorŞengül, Serdar
dc.contributor.authorZhao, Yuliang
dc.contributor.authorLan, Yu
dc.contributor.authorYang, Guowen
dc.contributor.authorDemir, Abdullah
dc.contributor.bilkentauthorEbadi, Kaveh
dc.contributor.bilkentauthorSünnetçioğlu, Ali Kaan
dc.contributor.bilkentauthorGündoğdu, Sinan
dc.contributor.bilkentauthorŞengül, Serdar
dc.contributor.bilkentauthorDemir, Abdullah
dc.coverage.spatialStrasbourg, Franceen_US
dc.date.accessioned2023-02-20T11:42:48Z
dc.date.available2023-02-20T11:42:48Z
dc.date.issued2022-05-20
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.description.abstractCatastrophic optical mirror damage (COMD) limits the output power and reliability of lasers diodes (LDs). Laser self heating together with facet absorption of output power cause the facet to reach a critical temperature (Tc), resulting in COMD and irreversible device failure. The self-heating of the laser contributes significantly to the facet temperature, but it has not been addressed so far. We implement a multi-section waveguide method where the heat is separated from reaching the output facet by exploiting an electrically isolated window. The laser waveguide is divided into two electrically isolated laser and transparent window sections. The laser section is pumped at high current levels to achieve laser output, and the passive waveguide is biased at low injection currents to obtain a transparent waveguide with negligible heat generation. Using this design, we demonstrate facet temperatures lower than the junction temperature of the laser even at high output power operation. While standard LDs show COMD failures, the multi-section waveguide LDs are COMD-free. Our technique and results provide a pathway for high-reliability LDs, which would find diverse applications in semiconductor lasers.en_US
dc.identifier.doi10.1117/12.2621651en_US
dc.identifier.eissn1996-756X
dc.identifier.urihttp://hdl.handle.net/11693/111547
dc.language.isoEnglishen_US
dc.publisherSPIEen_US
dc.relation.isversionofhttps://doi.org/10.1117/12.2621651en_US
dc.source.titleSemiconductor Lasers and Laser Dynamics Xen_US
dc.titleMulti-section waveguide method for facet temperature reduction and improved reliability of high-power laser diodesen_US
dc.typeConference Paperen_US
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