Atomic force microscopy: Methods and applications

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dc.contributor.authorBaykara, Mehmet Z.
dc.contributor.authorSchwarz, U. D.
dc.contributor.editorLindon, J.
dc.contributor.editorTranter, G. E.
dc.contributor.editorKoppenaal, D.
dc.date.accessioned2019-04-23T07:57:19Z
dc.date.available2019-04-23T07:57:19Z
dc.date.issued2017
dc.departmentDepartment of Mechanical Engineering
dc.description.abstractThis chapter provides an overview of atomic force microscopy, covering the fundamental aspects of the associated instrumentation and methodology as well as representative results from the literature highlighting a variety of application areas. In particular, atomic-resolution imaging and spectroscopy capabilities are emphasized, in addition to applications in biology, nanotribology and catalysis research. Finally, an outlook on emerging aspects and future prospects of atomic force microscopy is provided.
dc.identifier.doi10.1016/B978-0-12-409547-2.12141-9
dc.identifier.isbn9780128032244
dc.identifier.urihttp://hdl.handle.net/11693/50898
dc.language.isoEnglish
dc.publisherElsevier
dc.relation.ispartofEncyclopedia of Spectroscopy and Spectrometry
dc.relation.isversionofhttps://doi.org/10.1016/B978-0-12-409547-2.12141-9
dc.subjectAdhesion
dc.subjectAtomic force microscopy
dc.subjectBiomaterials
dc.subjectCatalysis
dc.subjectElasticity
dc.subjectForce spectroscopy
dc.subjectFriction
dc.subjectKelvin probe force microscopy
dc.subjectMetals
dc.subjectMetal oxides
dc.subjectNanomechanics
dc.subjectNanotribology
dc.subjectScanning probe microscopy
dc.subjectScanning tunneling microscopy
dc.subjectSemiconductors
dc.titleAtomic force microscopy: Methods and applications
dc.typeBook Chapter

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