BilKristal 4.0: A tool for crystal parameters extraction and defect quantification

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dc.citation.epage215en_US
dc.citation.spage214en_US
dc.citation.volumeNumber195en_US
dc.contributor.authorOkuyan, E.en_US
dc.contributor.authorOkuyan, C.en_US
dc.date.accessioned2016-02-08T10:27:39Z
dc.date.available2016-02-08T10:27:39Z
dc.date.issued2015en_US
dc.departmentDepartment of Computer Engineeringen_US
dc.description.abstractIn this paper, we present a revised version of BilKristal 3.0 tool. Raycast screenshot functionality is added to provide improved visual analysis. We added atomic distance analysis functionality to assess crystalline defects. We improved visualization capabilities by adding high level cut function definitions. Discovered bugs are fixed and small performance optimizations are made. © 2015 Elsevier B.V. All rights reserved.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T10:27:39Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2015en
dc.identifier.doi10.1016/j.cpc.2015.04.013en_US
dc.identifier.issn104655en_US
dc.identifier.urihttp://hdl.handle.net/11693/24325en_US
dc.language.isoEnglishen_US
dc.publisherElsevieren_US
dc.relation.isversionofhttp://dx.doi.org/10.1016/j.cpc.2015.04.013en_US
dc.source.titleComputer Physics Communicationsen_US
dc.subjectBasis vectorsen_US
dc.subjectChemistryen_US
dc.subjectCrystalen_US
dc.subjectCrystallographyen_US
dc.subjectMaterial scienceen_US
dc.subjectPattern recognitionen_US
dc.subjectPrimitive vectorsen_US
dc.subjectSpace groupen_US
dc.subjectSymmetryen_US
dc.subjectApplication programming interfaces (API)en_US
dc.subjectAtomsen_US
dc.subjectC++ (programming language)en_US
dc.subjectChemistryen_US
dc.subjectComputer graphicsen_US
dc.subjectComputer networksen_US
dc.subjectComputer operating systemsen_US
dc.subjectCrystal atomic structureen_US
dc.subjectCrystal defectsen_US
dc.subjectCrystal structureen_US
dc.subjectCrystallographyen_US
dc.subjectCrystalsen_US
dc.subjectInformation analysisen_US
dc.subjectInformation retrievalen_US
dc.subjectMolecular graphicsen_US
dc.subjectPattern recognitionen_US
dc.subjectPersonal computersen_US
dc.subjectProblem oriented languagesen_US
dc.subjectSoftware testingen_US
dc.subjectSurface defectsen_US
dc.subjectVector spacesen_US
dc.subjectVectorsen_US
dc.subjectVisualizationen_US
dc.subjectVolume renderingen_US
dc.subjectWindows operating systemen_US
dc.subjectBasis vectoren_US
dc.subjectDirect volume renderingen_US
dc.subjectMaterial scienceen_US
dc.subjectPerformance optimizationsen_US
dc.subjectSpace Groupsen_US
dc.subjectStatistical informationen_US
dc.subjectUnstructured tetrahedral meshesen_US
dc.subjectView dependent visualizationen_US
dc.subjectCrystal symmetryen_US
dc.titleBilKristal 4.0: A tool for crystal parameters extraction and defect quantificationen_US
dc.typeArticleen_US

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