BilKristal 4.0: A tool for crystal parameters extraction and defect quantification

Date
2015
Authors
Okuyan, E.
Okuyan, C.
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Supervisor
Co-Advisor
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Source Title
Computer Physics Communications
Print ISSN
104655
Electronic ISSN
Publisher
Elsevier
Volume
195
Issue
Pages
214 - 215
Language
English
Type
Article
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Abstract

In this paper, we present a revised version of BilKristal 3.0 tool. Raycast screenshot functionality is added to provide improved visual analysis. We added atomic distance analysis functionality to assess crystalline defects. We improved visualization capabilities by adding high level cut function definitions. Discovered bugs are fixed and small performance optimizations are made. © 2015 Elsevier B.V. All rights reserved.

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Keywords
Basis vectors, Chemistry, Crystal, Crystallography, Material science, Pattern recognition, Primitive vectors, Space group, Symmetry, Application programming interfaces (API), Atoms, C++ (programming language), Chemistry, Computer graphics, Computer networks, Computer operating systems, Crystal atomic structure, Crystal defects, Crystal structure, Crystallography, Crystals, Information analysis, Information retrieval, Molecular graphics, Pattern recognition, Personal computers, Problem oriented languages, Software testing, Surface defects, Vector spaces, Vectors, Visualization, Volume rendering, Windows operating system, Basis vector, Direct volume rendering, Material science, Performance optimizations, Space Groups, Statistical information, Unstructured tetrahedral meshes, View dependent visualization, Crystal symmetry
Citation
Published Version (Please cite this version)