Negative refraction and imaging beyond the diffraction limit by a two-dimensional left-handed metamaterial

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buir.contributor.authorÖzbay, Ekmel
buir.contributor.orcidÖzbay, Ekmel|0000-0003-2953-1828
dc.citation.epage115en_US
dc.citation.issueNumber1en_US
dc.citation.spage108en_US
dc.citation.volumeNumber6en_US
dc.contributor.authorÖzbay, Ekmelen_US
dc.contributor.authorAydin, K.en_US
dc.date.accessioned2016-02-08T10:09:31Z
dc.date.available2016-02-08T10:09:31Z
dc.date.issued2008en_US
dc.departmentNanotechnology Research Center (NANOTAM)en_US
dc.departmentDepartment of Physicsen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.description.abstractWe report our experimental results on two-dimensional left-handed metamaterials (LHM) exhibiting negative refraction and subwavelength imaging. Transmission and reflection spectra of LHM are studied and a left-handed transmission band is observed at the frequencies where both dielectric permittivity and magnetic permeability are negative. Impedance matching is verified both with the experiments and simulations. The two-dimensional LHM structure is verified to have a negative refractive index. We employed three different methods to observe negative refraction; refraction through prism-shaped LHM, beam shifting method, and phase shift experiments. We further demonstrated subwavelength imaging and resolution using LHM superlenses. The effect of thickness on the resolving power is investigated experimentally.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T10:09:31Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2008en
dc.identifier.doi10.1016/j.photonics.2007.09.003en_US
dc.identifier.eissn1569-4429
dc.identifier.issn1569-4410
dc.identifier.urihttp://hdl.handle.net/11693/23145
dc.language.isoEnglishen_US
dc.publisherElsevier BVen_US
dc.relation.isversionofhttp://doi.org/10.1016/j.photonics.2007.09.003en_US
dc.source.titlePhotonics and Nanostructures - Fundamentals and Applicationsen_US
dc.subjectMetamaterialen_US
dc.subjectLeft-handed materialen_US
dc.subjectNegative refractionen_US
dc.subjectSubwavelength imagingen_US
dc.subjectSuperlensen_US
dc.titleNegative refraction and imaging beyond the diffraction limit by a two-dimensional left-handed metamaterialen_US
dc.typeArticleen_US

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