Identification of insect damaged wheat kernels using transmittance images

Simple item page
buir.contributor.authorÇetin, A. Enis
buir.contributor.orcidÇetin, A. Enis|0000-0002-3449-1958
dc.citation.epage240en_US
dc.citation.issueNumber5en_US
dc.citation.spage238en_US
dc.citation.volumeNumber41en_US
dc.contributor.authorCataltepe, Z.en_US
dc.contributor.authorÇetin, A. Enisen_US
dc.contributor.authorPearson, T.en_US
dc.date.accessioned2016-02-08T10:23:57Z
dc.date.available2016-02-08T10:23:57Z
dc.date.issued2005en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.description.abstractTransmittance images of wheat kernels are used to classify insect damaged and undamaged wheat kernels. The histogram of pixel intensities of the wheat images were used as the features. Combination of the linear model and a radial basis function network in a committee resulted in a false positive rate of 0.1 at the true positive rate of 0.8 and an area under the receiver operating characteristics curve of 0.92.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T10:23:57Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2005en
dc.identifier.doi10.1049/el:20047250en_US
dc.identifier.eissn1350-911X
dc.identifier.issn0013-5194
dc.identifier.urihttp://hdl.handle.net/11693/24091
dc.language.isoEnglishen_US
dc.publisherThe Institution of Engineering and Technologyen_US
dc.relation.isversionofhttps://doi.org/10.1049/el:20047250en_US
dc.source.titleElectronics Lettersen_US
dc.titleIdentification of insect damaged wheat kernels using transmittance imagesen_US
dc.typeArticleen_US

Files

Original bundle

Now showing 1 - 1 of 1
Thumbnail Image
Name:
Identification of insect damaged wheat kernels using transmittance images.pdf
Size:
456.86 KB
Format:
Adobe Portable Document Format
Description:
Full printable version
Download

Collections

Scholarly Publications - Electrical and Electronics Engineering