Identification of insect damaged wheat kernels using transmittance images

Date

2005

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Source Title

Electronics Letters

Print ISSN

0013-5194

Electronic ISSN

1350-911X

Publisher

The Institution of Engineering and Technology

Volume

41

Issue

5

Pages

238 - 240

Language

English

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Abstract

Transmittance images of wheat kernels are used to classify insect damaged and undamaged wheat kernels. The histogram of pixel intensities of the wheat images were used as the features. Combination of the linear model and a radial basis function network in a committee resulted in a false positive rate of 0.1 at the true positive rate of 0.8 and an area under the receiver operating characteristics curve of 0.92.

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Published Version (Please cite this version)