Identification of insect damaged wheat kernels using transmittance images
Date
2005
Authors
Editor(s)
Advisor
Supervisor
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Co-Supervisor
Instructor
Source Title
Electronics Letters
Print ISSN
0013-5194
Electronic ISSN
1350-911X
Publisher
The Institution of Engineering and Technology
Volume
41
Issue
5
Pages
238 - 240
Language
English
Type
Journal Title
Journal ISSN
Volume Title
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Abstract
Transmittance images of wheat kernels are used to classify insect damaged and undamaged wheat kernels. The histogram of pixel intensities of the wheat images were used as the features. Combination of the linear model and a radial basis function network in a committee resulted in a false positive rate of 0.1 at the true positive rate of 0.8 and an area under the receiver operating characteristics curve of 0.92.