Identification of insect damaged wheat kernels using transmittance images

Date

2005

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Abstract

Transmittance images of wheat kernels are used to classify insect damaged and undamaged wheat kernels. The histogram of pixel intensities of the wheat images were used as the features. Combination of the linear model and a radial basis function network in a committee resulted in a false positive rate of 0.1 at the true positive rate of 0.8 and an area under the receiver operating characteristics curve of 0.92.

Source Title

Electronics Letters

Publisher

The Institution of Engineering and Technology

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Published Version (Please cite this version)

Language

English