Power dissipation analysis in tapping-mode atomic force microscopy

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buir.contributor.orcidAtalar, Abdullah|0000-0002-1903-1240
dc.citation.epage1934044en_US
dc.citation.issueNumber19en_US
dc.citation.spage1934041en_US
dc.citation.volumeNumber67en_US
dc.contributor.authorBalantekin, M.en_US
dc.contributor.authorAtalar, Abdullahen_US
dc.date.accessioned2016-02-08T10:30:10Z
dc.date.available2016-02-08T10:30:10Z
dc.date.issued2003en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.description.abstractIn a tapping-mode atomic force microscope, a power is dissipated in the sample during the imaging process. While the vibrating tip taps on the sample surface, some part of its energy is coupled to the sample. Too much dissipated power may mean the damage of the sample or the tip. The amount of power dissipation is related to the mechanical properties of a sample such as viscosity and elasticity. In this paper, we first formulate the steady-state tip-sample interaction force by a simple analytical expression, and then we derive the expressions for average and maximum power dissipated in the sample by means of sample parameters. Furthermore, for a given sample elastic properties we can determine approximately the sample damping constant by measuring the average power dissipation. Simulation results are in close agreement with our analytical approach.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T10:30:10Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2003en
dc.identifier.doi10.1103/PhysRevB.67.193404en_US
dc.identifier.issn0163-1829
dc.identifier.urihttp://hdl.handle.net/11693/24489
dc.language.isoEnglishen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttps://doi.org/10.1103/PhysRevB.67.193404en_US
dc.source.titlePhysical Review B - Condensed Matter and Materials Physicsen_US
dc.subjectAtomic force microscopyen_US
dc.subjectElasticityen_US
dc.subjectEnergy transferen_US
dc.subjectImagingen_US
dc.subjectMathematical analysisen_US
dc.subjectMolecular interactionen_US
dc.subjectSimulationen_US
dc.subjectVibrationen_US
dc.subjectViscosityen_US
dc.titlePower dissipation analysis in tapping-mode atomic force microscopyen_US
dc.typeArticleen_US

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