Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy

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dc.citation.epage1336en_US
dc.citation.issueNumber22en_US
dc.citation.spage1335en_US
dc.citation.volumeNumber37en_US
dc.contributor.authorSandhu, A.en_US
dc.contributor.authorMasuda, H.en_US
dc.contributor.authorKurosawa, K.en_US
dc.contributor.authorOral, A.en_US
dc.contributor.authorBending, S. J.en_US
dc.date.accessioned2016-02-08T10:34:25Z
dc.date.available2016-02-08T10:34:25Z
dc.date.issued2001en_US
dc.departmentDepartment of Physicsen_US
dc.description.abstractBismuth nano-Hall probes fabricated by using focused ion beam (FIB) milling were studied. The nano-Hall probes were used for direct magnetic imaging of domain structures in low coercivity garnets and demagnetized strontium ferrite permanent magnets. The analysis was performed using room temperature scanning Hall probe microscopy and it was found that the Bi nano-probes could overcome limitations due to surface depletion and large series resistances.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T10:34:25Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2001en
dc.identifier.doi10.1049/el:20010908en_US
dc.identifier.issn0013-5194
dc.identifier.urihttp://hdl.handle.net/11693/24793
dc.language.isoEnglishen_US
dc.publisherThe Institution of Engineering and Technology (IET)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1049/el:20010908en_US
dc.source.titleElectronics Lettersen_US
dc.subjectCoercive forceen_US
dc.subjectFerromagnetismen_US
dc.subjectGarnetsen_US
dc.subjectIon beamsen_US
dc.subjectMagnetic domainsen_US
dc.subjectMagnetic resonance imagingen_US
dc.subjectMagnetizationen_US
dc.subjectNanotechnologyen_US
dc.subjectPermanent magnetsen_US
dc.subjectPhotoresistsen_US
dc.subjectProbesen_US
dc.subjectScanning electron microscopyen_US
dc.subjectFocused ion beams (FIB)en_US
dc.subjectHall effect devicesen_US
dc.titleBismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopyen_US
dc.typeArticleen_US

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