Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy

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Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy.pdf (515.67 KB)

Date

2001

Authors

Sandhu, A.
Masuda, H.
Kurosawa, K.
Oral, A.
Bending, S. J.

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Source Title

Electronics Letters

Print ISSN

0013-5194

Electronic ISSN

Publisher

The Institution of Engineering and Technology (IET)

Volume

37

Issue

22

Pages

1335 - 1336

Language

English

Type

Article

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Abstract

Bismuth nano-Hall probes fabricated by using focused ion beam (FIB) milling were studied. The nano-Hall probes were used for direct magnetic imaging of domain structures in low coercivity garnets and demagnetized strontium ferrite permanent magnets. The analysis was performed using room temperature scanning Hall probe microscopy and it was found that the Bi nano-probes could overcome limitations due to surface depletion and large series resistances.

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Keywords

Coercive force , Ferromagnetism , Garnets , Ion beams , Magnetic domains , Magnetic resonance imaging , Magnetization , Nanotechnology , Permanent magnets , Photoresists , Probes , Scanning electron microscopy , Focused ion beams (FIB) , Hall effect devices

Citation

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http://hdl.handle.net/11693/24793

item.page.isversionof

http://dx.doi.org/10.1049/el:20010908

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Department of Physics