Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy
Date
2001
Authors
Sandhu, A.
Masuda, H.
Kurosawa, K.
Oral, A.
Bending, S. J.
Advisor
Instructor
Source Title
Electronics Letters
Print ISSN
0013-5194
Electronic ISSN
Publisher
The Institution of Engineering and Technology (IET)
Volume
37
Issue
22
Pages
1335 - 1336
Language
English
Type
Article
Journal Title
Journal ISSN
Volume Title
Abstract
Bismuth nano-Hall probes fabricated by using focused ion beam (FIB) milling were studied. The nano-Hall probes were used for direct magnetic imaging of domain structures in low coercivity garnets and demagnetized strontium ferrite permanent magnets. The analysis was performed using room temperature scanning Hall probe microscopy and it was found that the Bi nano-probes could overcome limitations due to surface depletion and large series resistances.
Course
Other identifiers
Book Title
Keywords
Coercive force, Ferromagnetism, Garnets, Ion beams, Magnetic domains, Magnetic resonance imaging, Magnetization, Nanotechnology, Permanent magnets, Photoresists, Probes, Scanning electron microscopy, Focused ion beams (FIB), Hall effect devices