LWIR all-atomic layer deposition ZnO bilayer microbolometer for thermal imaging

Date

2017

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Source Title

Optical Engineering

Print ISSN

0091-3286

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SPIE

Volume

56

Issue

3

Pages

037106-1 - 037106-5

Language

English

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Abstract

We propose an all-ZnO bilayer microbolometer, operating in the long-wave infrared regime that can be implemented by consecutive atomic layer deposition growth steps. Bilayer design of the bolometer provides very high absorption coefficients compared to the same thickness of a single ZnO layer. High absorptivity of the bilayer structure enables higher performance (lower noise equivalent temperature difference and time constant values) compared to single-layer structure. We observe these results computationally by conducting both optical and thermal simulations. © 2017 Society of Photo-Optical Instrumentation Engineers (SPIE).

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