Near field imaging in microwave regime using double layer split-ring resonator based metamaterial

buir.contributor.authorÖzbay, Ekmel
buir.contributor.orcidÖzbay, Ekmel|0000-0003-2953-1828
dc.citation.epage216en_US
dc.citation.issueNumber3en_US
dc.citation.spage213en_US
dc.citation.volumeNumber14en_US
dc.contributor.authorGuven, K.en_US
dc.contributor.authorÖzbay, Ekmelen_US
dc.date.accessioned2016-02-08T10:17:34Z
dc.date.available2016-02-08T10:17:34Z
dc.date.issued2006en_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.departmentDepartment of Physicsen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.departmentNanotechnology Research Center (NANOTAM)en_US
dc.description.abstractA planar metamaterial structure consisting of two layers of split-ring resonator (SRR) arrays is demonstrated to form the image of a point source with subwavelength resolution. The source frequency is swept through the resonance gap of the metamaterial layers and the lateral field intensity distribution is recorded on the transmission side of the metamaterial. When the source is tuned to the resonance frequency of SRRs, the metamaterial acts as a high permeability medium and a distinct image with subwavelength resolution in the lateral direction is obtained. Increasing the distance between the individual SRR layers reduces the interlayer coupling, and the intensity and spatial resolution of the image decrease rapidly.en_US
dc.identifier.doi10.2478/s11772-006-0028-7en_US
dc.identifier.eissn1896-3757
dc.identifier.issn1230-3402
dc.identifier.urihttp://hdl.handle.net/11693/23688
dc.language.isoEnglishen_US
dc.publisherSciendoen_US
dc.relation.isversionofhttps://doi.org/10.2478/s11772-006-0028-7en_US
dc.source.titleOpto-electronics Reviewen_US
dc.subjectMetamaterialen_US
dc.subjectSubwavelength imagingen_US
dc.subjectNear field imagingen_US
dc.titleNear field imaging in microwave regime using double layer split-ring resonator based metamaterialen_US
dc.typeArticleen_US

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