Solar-blind A1GaN-based p-i-n photodiodes with low dark current and high detectivity
buir.contributor.author | Özbay, Ekmel | |
buir.contributor.author | Bıyıklı, Necmi | |
buir.contributor.orcid | Özbay, Ekmel|0000-0003-2953-1828 | |
dc.citation.epage | 1720 | en_US |
dc.citation.issueNumber | 7 | en_US |
dc.citation.spage | 1718 | en_US |
dc.citation.volumeNumber | 16 | en_US |
dc.contributor.author | Bıyıklı, Necmi | en_US |
dc.contributor.author | Kimukin, I. | en_US |
dc.contributor.author | Aytur, O. | en_US |
dc.contributor.author | Özbay, Ekmel | en_US |
dc.date.accessioned | 2016-02-08T10:26:38Z | |
dc.date.available | 2016-02-08T10:26:38Z | |
dc.date.issued | 2004 | en_US |
dc.department | Department of Electrical and Electronics Engineering | en_US |
dc.department | Department of Physics | en_US |
dc.description.abstract | We report solar-blind AlxGal1-xN-based heterojunction p-i-n photodiodes with low dark current and high detectivity. After the p+ GaN cap layer was recess etched, measured dark current was below 3 fA for reverse bias values up to 6 V. The device responsivity increased with reverse bias and reached 0.11 A/W at 261 nm under 10-V reverse bias. The detectors exhibited a cutoff around 283 nm, and a visible rejection of four orders of magnitude at zero bias. Low dark current values led to a high differential resistance of 9.52 × 1015 Ω. The thermally limited detectivity of the devices was calculated as 4.9 × 1014 cm · Hz1/2W-1. © 2004 IEEE. | en_US |
dc.description.provenance | Made available in DSpace on 2016-02-08T10:26:38Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2004 | en |
dc.identifier.doi | 10.1109/LPT.2004.829526 | en_US |
dc.identifier.issn | 1041-1135 | |
dc.identifier.uri | http://hdl.handle.net/11693/24267 | |
dc.language.iso | English | en_US |
dc.publisher | IEEE | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1109/LPT.2004.829526 | en_US |
dc.source.title | IEEE Photonics Technology Letters | en_US |
dc.subject | Aluminum gallium nitride | en_US |
dc.subject | Dark current | en_US |
dc.subject | Sapphire substrate | en_US |
dc.subject | Spectral responsivity | en_US |
dc.subject | Current density | en_US |
dc.subject | Current voltage characteristics | en_US |
dc.subject | Electric current measurement | en_US |
dc.subject | Gallium nitride | en_US |
dc.subject | Heterojunctions | en_US |
dc.subject | Metallorganic chemical vapor deposition | en_US |
dc.subject | Ohmic contacts | en_US |
dc.subject | Photodetectors | en_US |
dc.subject | Plasma enhanced chemical vapor deposition | en_US |
dc.subject | Reactive ion etching | en_US |
dc.subject | Semiconducting aluminum compounds | en_US |
dc.subject | Substrates | en_US |
dc.subject | Photodiodes | en_US |
dc.title | Solar-blind A1GaN-based p-i-n photodiodes with low dark current and high detectivity | en_US |
dc.type | Article | en_US |
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