Solar-blind A1GaN-based p-i-n photodiodes with low dark current and high detectivity
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2004
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We report solar-blind AlxGal1-xN-based heterojunction p-i-n photodiodes with low dark current and high detectivity. After the p+ GaN cap layer was recess etched, measured dark current was below 3 fA for reverse bias values up to 6 V. The device responsivity increased with reverse bias and reached 0.11 A/W at 261 nm under 10-V reverse bias. The detectors exhibited a cutoff around 283 nm, and a visible rejection of four orders of magnitude at zero bias. Low dark current values led to a high differential resistance of 9.52 × 1015 Ω. The thermally limited detectivity of the devices was calculated as 4.9 × 1014 cm · Hz1/2W-1. © 2004 IEEE.
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IEEE Photonics Technology Letters
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IEEE
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Aluminum gallium nitride, Dark current, Sapphire substrate, Spectral responsivity, Current density, Current voltage characteristics, Electric current measurement, Gallium nitride, Heterojunctions, Metallorganic chemical vapor deposition, Ohmic contacts, Photodetectors, Plasma enhanced chemical vapor deposition, Reactive ion etching, Semiconducting aluminum compounds, Substrates, Photodiodes
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English