Observation of defect formation in metamaterials

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buir.contributor.authorÖzbay, Ekmel
buir.contributor.orcidÖzbay, Ekmel|0000-0003-2953-1828
dc.citation.epage2en_US
dc.citation.spage1en_US
dc.contributor.authorÇağlayan, Hümeyraen_US
dc.contributor.authorBulu, I.en_US
dc.contributor.authorLoncar, M.en_US
dc.contributor.authorÖzbay, Ekmelen_US
dc.coverage.spatialRochester, New York United States
dc.date.accessioned2016-02-08T11:39:12Z
dc.date.available2016-02-08T11:39:12Z
dc.date.issued2008-10en_US
dc.departmentDepartment of Physicsen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.departmentNanotechnology Research Center (NANOTAM)en_US
dc.descriptionDate of Conference: 19–23 October 2008
dc.descriptionConference name: Plasmonics and Metamaterials 2008
dc.description.abstractWe report subwavelength localization of electromagnetic fields within cavities based on metamaterials. Cavity resonances are observed in the transmission spectrum of a split ring resonator and composite metamaterials cavity structures. These cavity resonances are shown to exhibit high quality factors. Since the unit cells of metamaterials are much smaller than the operation wavelength, subwavelength localization is possible within these metamaterial cavity structures. In the present paper, we show that the electromagnetic field is localized into a region of λ/8, where λ is the cavity resonance wavelength.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T11:39:12Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2008en
dc.identifier.issn2162-2701
dc.identifier.urihttp://hdl.handle.net/11693/26907
dc.language.isoEnglishen_US
dc.publisherOSAen_US
dc.source.titleOptics InfoBase Conference Papersen_US
dc.subjectElectromagnetic fieldsen_US
dc.subjectPlasmonsen_US
dc.subjectCavity resonancesen_US
dc.subjectComposite metamaterialsen_US
dc.subjectDefect formationen_US
dc.subjectHigh quality factorsen_US
dc.subjectOperation wavelengthen_US
dc.subjectSplit ring resonatoren_US
dc.subjectSub-wavelength localizationen_US
dc.subjectTransmission spectrumsen_US
dc.subjectMetamaterialsen_US
dc.titleObservation of defect formation in metamaterialsen_US
dc.typeConference Paperen_US

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