Noncontact lateral-force gradient measurement on Si(111)-7×7 surface with small-amplitude off-resonance atomic force microscopy
dc.citation.epage | 1005 | en_US |
dc.citation.issueNumber | 2 | en_US |
dc.citation.spage | 1001 | en_US |
dc.citation.volumeNumber | 27 | en_US |
dc.contributor.author | Atabak, M. | en_US |
dc.contributor.author | Ünverdi O. | en_US |
dc.contributor.author | Özer H.O. | en_US |
dc.contributor.author | Oral, A. | en_US |
dc.date.accessioned | 2016-02-08T10:04:34Z | |
dc.date.available | 2016-02-08T10:04:34Z | |
dc.date.issued | 2009 | en_US |
dc.department | Department of Physics | en_US |
dc.description.abstract | In this work, the authors report on a quantitative investigation of lateral-force gradient and lateral force between a tungsten tip and Si (111) - (7×7) surface using combined noncontact lateral-force microscopy and scanning tunneling microscopy. Simultaneous lateral-force gradient and scanning tunneling microscopy images of single and multiatomic step are obtained. In our measurement, tunnel current is used as feedback. The lateral-stiffness contrast has been observed to be 2.5 Nm at a single atomic step, in contrast to 13 Nm at a multiatomic step on Si (111) surface. They also carried out a series of lateral stiffness-distance spectroscopy, which show a sharp increase in tip-surface interaction stiffness as the sample is approached toward the surface. © 2009 American Vacuum Society. | en_US |
dc.description.provenance | Made available in DSpace on 2016-02-08T10:04:34Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2009 | en |
dc.identifier.doi | 10.1116/1.3097857 | en_US |
dc.identifier.issn | 10711023 | |
dc.identifier.uri | http://hdl.handle.net/11693/22773 | |
dc.language.iso | English | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1116/1.3097857 | en_US |
dc.source.title | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures | en_US |
dc.subject | Atomic forces | en_US |
dc.subject | Atomic steps | en_US |
dc.subject | Force gradients | en_US |
dc.subject | Lateral forces | en_US |
dc.subject | Lateral stiffness | en_US |
dc.subject | Lateral-force microscopies | en_US |
dc.subject | Noncontact | en_US |
dc.subject | Off resonances | en_US |
dc.subject | Quantitative investigations | en_US |
dc.subject | Sharp increase | en_US |
dc.subject | Si (1 1 1) | en_US |
dc.subject | Tip-surface interactions | en_US |
dc.subject | Tungsten tips | en_US |
dc.subject | Tunnel currents | en_US |
dc.subject | Scanning | en_US |
dc.subject | Scanning tunneling microscopy | en_US |
dc.subject | Silicon | en_US |
dc.subject | Tungsten | en_US |
dc.subject | Stiffness | en_US |
dc.title | Noncontact lateral-force gradient measurement on Si(111)-7×7 surface with small-amplitude off-resonance atomic force microscopy | en_US |
dc.type | Article | en_US |
Files
Original bundle
1 - 1 of 1
Loading...
- Name:
- Noncontact_lateral-force_gradient_measurement_on_Si(111)-7×7_surface_with_small-amplitude_off-resonance_atomic_force_microscopy.pdf
- Size:
- 382 KB
- Format:
- Adobe Portable Document Format
- Description:
- Full printable version