Noncontact lateral-force gradient measurement on Si(111)-7×7 surface with small-amplitude off-resonance atomic force microscopy

Date

2009

Authors

Atabak, M.
Ünverdi O.
Özer H.O.
Oral, A.

Editor(s)

Advisor

Supervisor

Co-Advisor

Co-Supervisor

Instructor

BUIR Usage Stats
3
views
6
downloads

Citation Stats

Series

Abstract

In this work, the authors report on a quantitative investigation of lateral-force gradient and lateral force between a tungsten tip and Si (111) - (7×7) surface using combined noncontact lateral-force microscopy and scanning tunneling microscopy. Simultaneous lateral-force gradient and scanning tunneling microscopy images of single and multiatomic step are obtained. In our measurement, tunnel current is used as feedback. The lateral-stiffness contrast has been observed to be 2.5 Nm at a single atomic step, in contrast to 13 Nm at a multiatomic step on Si (111) surface. They also carried out a series of lateral stiffness-distance spectroscopy, which show a sharp increase in tip-surface interaction stiffness as the sample is approached toward the surface. © 2009 American Vacuum Society.

Source Title

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Publisher

Course

Other identifiers

Book Title

Degree Discipline

Degree Level

Degree Name

Citation

Published Version (Please cite this version)

Language

English