Novel integrated optical displacement sensor for scanning force microscopies
Date
2003
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Abstract
A novel displacement sensor for scanning force microscoples using an integrated optical micro-ring resonator is described. Device operates by monitoring the changes in transmission spectrum of micro-ring resonator. This design provides sensitivities about ∼10-4 Å-1.
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Proceedings of the 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS 2003
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IEEE
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Computer simulation, Finite element method, Integrated optoelectronics, Microscopic examination, Optical design, Optical resonators, Optical waveguides, Photoelasticity, Refractive index, Strain measurement, Three dimensional, Micro-ring resonator, Optical displacement sensor, Scanning force microscopy, Software Package ANSYS, Optical sensors
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English