Reflection properties and defect formation in metallic photonic crystals

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Abstract

The reflection properties of layer-by-layer metallic photonic crystals were investigated using metallic photonic crystals with simple-tetragonal (st) structure. The observed properties were used to predict defect formation in these crystals. The reflection and transmission amplitude characteristics were measured by a network analyzer and standard gain horn antennas. Transformation matrix method was employed for the theoretical simulations.

Source Title

Technical Digest - Summaries of Papers Presented at the International Quantum Electronics Conference - Conference Edition, 1998

Publisher

IEEE

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Citation

Published Version (Please cite this version)

Language

English