Comparison of surface-modeling techniques

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buir.contributor.authorGürel, Levent
dc.citation.epage1837en_US
dc.citation.spage1834en_US
dc.contributor.authorSertel, Kubilayen_US
dc.contributor.authorGürel, Leventen_US
dc.coverage.spatialMontreal, Quebec, Canada
dc.date.accessioned2016-02-08T11:59:56Zen_US
dc.date.available2016-02-08T11:59:56Zen_US
dc.date.issued1997-07en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.descriptionDate of Conference: 13-18 July 1997
dc.descriptionConference name: IEEE Antennas and Propagation Society International Symposium 1997. Digest
dc.description.abstractSolution techniques based on surface integral equations are widely used in computational electromagnetics. The accurate surface models increase the accuracy solutions by using exact and flat-triangulation models for a sphere. For a required solution accuracy, the problem size is significantly reduced by using geometry models for the scatterers. The dependence of the accuracy of the solution on the geometry modeling is investigated.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T11:59:56Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 1997en
dc.identifier.doi10.1109/APS.1997.631619
dc.identifier.issn0272-4693en_US
dc.identifier.urihttp://hdl.handle.net/11693/27706
dc.language.isoEnglishen_US
dc.publisherIEEEen_US
dc.relation.isversionofhttps://doi.org/10.1109/APS.1997.631619
dc.source.titleIEEE Antennas and Propagation Society, AP-S International Symposium (Digest)en_US
dc.subjectAlgorithmsen_US
dc.subjectElectromagnetic wave scatteringen_US
dc.subjectFunctionsen_US
dc.subjectIntegral equationsen_US
dc.subjectMathematical modelsen_US
dc.subjectPolynomialsen_US
dc.subjectProblem solvingen_US
dc.subjectBasic functionsen_US
dc.subjectSurface integral equations (SIE) methoden_US
dc.subjectElectromagnetic field theoryen_US
dc.titleComparison of surface-modeling techniquesen_US
dc.typeConference Paperen_US

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