High‐performance acoustic microscope

buir.contributor.orcidAtalar, Abdullah|0000-0002-1903-1240
dc.citation.epage2576en_US
dc.citation.issueNumber10en_US
dc.citation.spage2568en_US
dc.citation.volumeNumber57en_US
dc.contributor.authorAtalar, Abdullahen_US
dc.contributor.authorHoppe, Martinen_US
dc.date.accessioned2019-03-27T13:02:32Z
dc.date.available2019-03-27T13:02:32Z
dc.date.issued1986-06en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.description.abstractA commercial scanning acoustic microscope operating in the frequency range of 50–2000 MHz is described. It has a stable scan mechanism suitable for the high‐frequency end to give high‐resolution images and modes to allow for material characterization at the low‐frequency end. The high‐frequency electronics permitting a wideband operation with a variety of acoustic lenses are described. Microprocessors control many parts of the the instrument to release the user from the routine adjustments, resulting in a user‐friendly interface. Images are presented to show the resolution and penetration abilities of the instrument at several frequencies, along with comparative optical images.en_US
dc.description.provenanceSubmitted by Taner Korkmaz (tanerkorkmaz@bilkent.edu.tr) on 2019-03-27T13:02:32Z No. of bitstreams: 1 High‐performance_acoustic_microscope.pdf: 862666 bytes, checksum: dac162b30e8b2ad957989adefb73d25a (MD5)en
dc.description.provenanceMade available in DSpace on 2019-03-27T13:02:32Z (GMT). No. of bitstreams: 1 High‐performance_acoustic_microscope.pdf: 862666 bytes, checksum: dac162b30e8b2ad957989adefb73d25a (MD5) Previous issue date: 1986-06en
dc.identifier.doi10.1063/1.1139061en_US
dc.identifier.eissn1089-7623
dc.identifier.issn0034-6748
dc.identifier.urihttp://hdl.handle.net/11693/50710
dc.language.isoEnglishen_US
dc.publisherA I P Publishingen_US
dc.relation.isversionofhttps://doi.org/10.1063/1.1139061en_US
dc.source.titleReview of Scientific Instrumentsen_US
dc.titleHigh‐performance acoustic microscopeen_US
dc.typeArticleen_US

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