Dependence of Josephson junction critical current on the deposition rate of YBa2Cu3O7-δ thin films
Date
2007
Editor(s)
Advisor
Supervisor
Co-Advisor
Co-Supervisor
Instructor
Source Title
AIP Conference Proceedings
Print ISSN
0094-243X
Electronic ISSN
Publisher
American Institute of Physics
Volume
899
Issue
Pages
762
Language
English
Type
Journal Title
Journal ISSN
Volume Title
Series
Abstract
We have reported the effect of YBa2Cu3O 7-δ (YBCO) thin film deposition rate on the 24 and 30 degree STO bicrystal Josephson junctions critical currents by fabricating series of junctions with different deposition rates. Dependence of YBCO thin film structures on the deposition rate was investigated. We have observed that the critical currents of junctions are strongly affected by the thin film deposition rate.